Thursday, September 13, 2012

1209.2483 (Feng Shi et al.)

Universal supercritical current distributions in 3D random resistor

Feng Shi, Simi Wang, Peter J. Mucha, M. Gregory Forest
Inspired by percolation-induced properties of nano-particle composites [Nan et al., Annu. Rev. Mater. Res. 40, 131 (2010)], and in particular the robust electrical property gains at and above percolation threshold, we revisit the classical setting of percolation in random resistor networks. We simulate and analyze scaling behaviors of the percolation-induced distribution of currents in the network, first confirming the celebrated power-law distribution of small currents. We further identify a robust exponential distribution in the large current tail that persists above but close to threshold, whereas the power-law scaling in the small currents does not.
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